Uncertainties with data channels collected either from test equipment or test setups could provide insight into how much you can trust collected and presented data.

Starting at a base level of test equipment capabilities and then combinations of other parameters, how do we store this metadata and how does it pass from raw data through filters and up to the user for presentation?

One example from IRC conversations would be:

a unit could hypothetically be "volts with a 95% confidence interval of +/- 5 mV offset and 1% magnitude"

This would be measured by a scope channel, then a math filter might divide that channel with a 100mΩ 1% resistor to yield Amp units with the proper combination of error propagation.

Linear error propagation may not be the correct option for errors, further discussion is needed.